Al-based anodic oxide films structure observation using field emission gun scanning electron microscopy

Al-based anodic oxide films structure observation using field emission gun scanning electron microscopy

Author Regone, N. N. Google Scholar
Freire, CMA Google Scholar
Ballester, M. Google Scholar
Institution Universidade Federal de São Paulo (UNIFESP)
Universidade Estadual de Campinas (UNICAMP)
Abstract In the present work, the anodic oxide films of Al, Al-Cu 4.5% and Al-Si 6.5% alloys are formed using direct and pulse current. in the case of Al-Cu and Al-Si alloys, the electrolyte used contains sulfuric acid and oxalic acid, meanwhile for Al the electrolyte contains sulfuric acid only. Al-Cu alloy was submitted to a heat treatment in order to decrease the effect of inter metallic phase theta upon the anodic film structure. Fractured samples were observed using a field emission gun scanning electron microscope JSM-6330F at (LME)/Brazilian Synchrotron Light Laboratory (LNLS), Campinas, SP, Brazil. the oxide film images enable evaluation of the pore size and form with a resolution similar to the transmission electron microscope (TEM) resolution. It is also observed that the anodizing process using pulse current produces an irregular structure of pore walls, and by direct cur-rent it is produced a rectilinear pore wall. (c) 2005 Elsevier B.V. All rights reserved.
Keywords anodizing
field emission gun microscopy
aluminum
Al-Cu alloy
Al-Si alloy
Language English
Date 2006-02-20
Published in Journal of Materials Processing Technology. Lausanne: Elsevier Science Sa, v. 172, n. 1, p. 146-151, 2006.
ISSN 0924-0136 (Sherpa/Romeo, impact factor)
Publisher Elsevier B.V.
Extent 146-151
Origin http://dx.doi.org/10.1016/j.jmatprotec.2005.09.005
Access rights Closed access
Type Article
Web of Science ID WOS:000235379700019
URI http://repositorio.unifesp.br/handle/11600/28751

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